hdl:10013/epic.25633
Application of gas-phase FTIR and microwave spectroscopy for characterization and determination of impurities in SiF4
Sennikov, Peter, Chuprov, L. A., Ignatov, Stanislav, Vaks, V. L., Tokhadze, K. G. and Schrems, Otto
;
Contact
oschrems [ at ] awi-bremerhaven.de
Abstract
Item Type
Conference
(Poster)
Authors
Sennikov, Peter, Chuprov, L. A., Ignatov, Stanislav, Vaks, V. L., Tokhadze, K. G. and Schrems, Otto
;
Divisions
Programs
Helmholtz Research Programs > MARCOPOLI (2004-2008) > POL-MARCOPOLI
Helmholtz Research Programs > MARCOPOLI (2004-2008) > POL1-Processes and interactions in the polar climate system
Helmholtz Research Programs > MARCOPOLI (2004-2008) > POL1-Processes and interactions in the polar climate system
Publication Status
Published
Event Details
The 25th Conference on Precision Electromagnetic Measurements (CPEM-2006), 9-14 July, Turin, Italy..
Eprint ID
15504
Cite as
Sennikov, P.
,
Chuprov, L. A.
,
Ignatov, S.
,
Vaks, V. L.
,
Tokhadze, K. G.
and
Schrems, O.
(2006):
Application of gas-phase FTIR and microwave spectroscopy for characterization and determination of impurities in SiF4
,
The 25th Conference on Precision Electromagnetic Measurements (CPEM-2006), 9-14 July, Turin, Italy.
.
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